JA Woollam Infrared Variable Angle Spectroscopic Ellipsometer (IR-VASE)

This cutting-edge instrument sets the standard for precision in characterising thin films and nanostructures.

Re-define your research applications

Offering a broad spectral range and variable angle capabilities, the IR-VASE provides insights into material properties with unparalleled accuracy. Its user-friendly interface and customizable measurement parameters ensure versatility for a wide range of research applications, from semiconductor development to surface science.

Lady working with the JA Woollam Infrared Variable Angle Spectroscopic Ellipsometer (IR-VASE).

Spectroscopic Ellipsometry with the JA Woollam IR-Vase II

Spectroscopic ellipsometry is a highly sophisticated and non-destructive metrology tool.

The innovation in Surfaces, Materials and Related Technologies (iSMART) research group, led by Dr. Nikolaos Kalfagiannis and co-workers from Université de Poitiers, Sheffield Hallam University and the University of Nottingham, utilised this equipment in their extensive research into optical and electronic properties of materials and thin films.

Get in touch

Learn more about this and other equipment and facilities available at MTIF.